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 Raytrex C32

•RFIC Testing Solutions
•IoT Testing Solution
•Full CIS Solution Coverage
•Utilization Maximization - Solution fits for both CIS and finger print
•Throughput Maximization - 32 Sites Production Proven
•Easy to expand from 192 channels configuration to over 3000 channels
•Easy to support future application upgrades – AXIE and PXIE Systems
  Support
•Profession Team Support – From Characterization to Production

 

 


 IoT Testing Solution RFIC Testing Solutions

   Key Features & Specifications
• Optimize multi-device testing
  –Up to four TRX channels per EXM, with up to 6 GHz bandwidth on each TRX
  –Two full-duplex and two half-duplex or four full-duplex ports per TRX
• Test multi-format devices
  –Cellular, 802.11a/b/g/n/j/p/ac/af/ah, Bluetooth®, Zigbee ...etc.
• Maximize throughput and yield
  –Accelerate test execution by capturing multiple format cellular and WLAN measurements
    via advanced sequencing and single-acquisition multiple measurements (SAMM)"
  –Receiver EVM for 160 MHz 802.11ac: ≤ –43 dB (typical)
  –Absolute level accuracy, 380 MHz to 3.8 GHz: ≤ ±0.2 dB (typical)
  –Output power range, 380 MHz to 6 GHz: +5 to –130 dBm (typical)
• Get up and running in hours, not days, with validated turnkey chipset solutions
  –Reduce test-development time and cost with chipset-specific calibration and verification routines
  –Leverage local application engineers' expertise to optimize the EXM for your needs


 RFIC Testing Solutions
•Key Features
  –Automated digital pre-distortion and envelope tracking for fast design and characterization
  –Make fast measurements with real-time signal processing
  –Validate wireless standards compliance through power & demodulation measurements
  –Measure full S-parameters of highly complex devices with multiple ports
  –Multi-Site Support Capabilities
  – Portable to major testers, like S100, S50
•Key Spec
  –Fast Servo loop convergence: < 3 ms, nominal
  –Fast ACPR measurements: < 500 µs, nominal
  –Fast full 2-port S-parameter measurements: 28 - 33 ms across 401 points, nominal
  –Fast DPD open loop measurement: < 100 ms, nominal


 Raytrex CIS Solution Introduction
Capture Card, 1.5G
•Raytrex CIS Capture Card, Z4+
  –High Speed Testing Link, 1.5 MIPI Interface Support
  –On Board Processor Support for Concurrent Testing Methodology Maximize Throughput
  –On Board DRAM/Flash For Image Pre-Setup Support
  –Smallest Foot Print for Multi-Site Support
  –Full Integrated Test Program Development Software Environment with Image Libraries
    Support
64 Sites/IPC Solution Introduction
•Key Features/Advantages
  –Software KVM to reduce hardware cost
  –Small Foot Print
  –Parallel Testing Maximization
Light Source
•Raytrex Light Source D50-WAIRC
  –Highest Quality to Support Halogen Light Source Level Testing Environment with 99% High Uniformity
  –Wide Application Coverage from Handset, Security, Automotive
  –A light/IR/Multi Color Temperature Support
    Support full Application Coverage from Handset, Security, Automotive to Fingerprint with our
    Customized Capability
Tester
•Raytrex CIS Handler (RTX 2500)
  –CLCC/PLCC CIS Testing Support
  –Maximum 32 Sites Design to Maximize Output
  –Digital and Image Testing Simultaneously to Minimize test time and Reduce the Hardware Cost
•Easy Expandable from 192 channels to to over 3000 channels
•High Multi-Site Production Proven (32 Sites)
•Parallel OTP (One Time Password) Support
•Deep Memory Depth (128MV) Support for Scan Test

 

 

 

 

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